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Z-direction
in characterizing surface roughness, the direction perpendicular to the sample plane, orthogonal to the X and Y directions. Also called feature height direction.
Z-direction
in characterizing surface roughness, the direction perpendicular to the sample plane, orthogonal to the X and Y directions. Also called feature height direction.
Zee purge
a configuration of purging manifold, similar to the"cross" purge, in which the purge gas inlet valve is connected to an inlet port of a three-ported, two-way regulator isolation valve.
zee purge
a configuration of purging manifold, similar to the"cross" purge, in which the purge gas inlet valve is connected to an inlet port of a three-ported, two-way regulator isolation valve.
Zener diode
A semiconductor P-N junction diode that has a controlled reverse-bias breakdown voltage, and is used to supply (clamp) a specific voltage for other protected components (for example in an IC). The Zener effect describes a tunnel breakdown phenomenon that is restricted to less than 5V. However, Zener diodes are traditionally used to describe any reverse-bias P-N junction device used to supply a specific voltage, even those of several hundred volts.
zeolite
a group of white or colorless (sometimes red or yellow) hydrous tectosilicate minerals characterized by an aluminosilicate tetrahedral framework, ion-exchangeable large cations, and loosely held water molecules permitting reversible dehydration.
Zeolite
a group of white or colorless (sometimes red or yellow) hydrous tectosilicate minerals characterized by an aluminosilicate tetrahedral framework, ion-exchangeable large cations, and loosely held water molecules permitting reversible dehydration.
zero dislocations
a single-crystal semiconductor with a dislocation density of fewer than 500 dislocations per square centimeter. Also called zero and zero D.
Zero dislocations
a single-crystal semiconductor with a dislocation density of fewer than 500 dislocations per square centimeter. Also called zero and zero D.
Zero effect
in flat panel displays, the change in zero due to a change in ambient temperature from one normal operating temperature to a second normal operating temperature. All other conditions must be held within the limits of reference operating conditions.
zero effect
in flat panel displays, the change in zero due to a change in ambient temperature from one normal operating temperature to a second normal operating temperature. All other conditions must be held within the limits of reference operating conditions.
zero gas
in determining contaminant contribution by gas distribution system components, a purified gas that has an impurity concentration below the minimum detection limit (MDL) of the analytical instrument. This gas is used for both instrument calibration and component testing.
Zero gas
in determining contaminant contribution by gas distribution system components, a purified gas that has an impurity concentration below the minimum detection limit (MDL) of the analytical instrument. This gas is used for both instrument calibration and component testing.
Z-plane
in measuring semiconductor leadframes for characteristics such as lead and die pad planarity, the reference Z-plane is defined as the average of the height of the two dambars when measured at their geometric center, given that the dambars do not differ in location by more than 0.003 in.
Z-plane
in measuring semiconductor leadframes for characteristics such as lead and die pad planarity, the reference Z-plane is defined as the average of the height of the two dambars when measured at their geometric center, given that the dambars do not differ in location by more than 0.003 in.
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